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Plenary Speakers

cessful instruments for electron

microscopy, including electron

energy loss spectro-

meters (EELS), ima-

ging filters, CCD

cameras, aberration

correctors, a whole

electron microscope,

and a revolutiona-

ry monochromator.

His work has led to

the first successful

aberration corrector

for a scanning tran-



microscope (STEM)

in 1997, sub-Å resolution STEM

imaging in 2002, atom-by-atom

analysis of 2D samples in 2010,

-driven self-assembly and self-

-organization; and the physics of

carbon nanotube de-

vices. His early work

includes now-classic

theories of scanning

tunneling microsco-

py, Schottky barriers,

and heterojunction

band lineups. He also

developed model in-

teratomic potentials

that are widely used

in materials simula-

tions. His work has

been recognized by

the Davisson-Germer Prize of

the American Physical Society,

the Medard Welch Award of the

American Vacuum Society, and

the MRS Medal. He is a member

of the National Academy of Engi-

neering, and a Fellow of the APS,

Ondřej L.


J. D.



Nion, Research and Develop-

ment, Kirkland, USA;



State University, Department of

Physics, Tempe, USA

IBM TJ Watson Research

Center, IBM Research Division,

Yorktown Heights- NY 10598,


vibrational spectroscopy in the

electron microscope in 2014, and

4.2 meV energy

resolution EELS

in 2018. It has

been cited over


AVS, and MRS. His papers have

been cited over 36,000 times, with

an h-index of 85,

and he is first

author of 9 pa-

pers cited over

1000 times (sole

author of 6). He

has served on

the Board of

Directors of the



search Society

(2003-2005) and

on the Editorial

Board of Journal

of Applied Physics and Applied

Physics Letters (2001-2003). He

received his B.A. in Physics with

High Honors from Swarthmore

College, and his Ph.D. in Physics

from the University of California,


Ondřej L. Křivánek FRS grew

up in Prague, and has a Ph.D. in

Physics from Cambridge Univer-

sity. He is currently the President

of Nion, which he co-founded in

1997, and Adjunct Professor at

Arizona State University (ASU).

He has designed many suc-

Jerry Tersoff is a Principal Re-

search Staff member at the IBM

Thomas J. Watson Research

Center. He has worked in diver-

se areas relating to the theory

of surfaces, interfaces, materials

physics, and nanoscale device

physics. His recent research in-

cludes semiconductor nanowi-

re growth; nanoscale effects in

heteroepitaxy, including stress-